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"For outstanding technical contributions to fluoroscopic X-ray systems and fast scan, 'fan-beam' computed X-ray tomography systems, and for leadership in managing the development, engineering, and marketing of world-leading commercial medical imaging systems."Background:
Dr. Lewis S. (Lonnie) Edelheit is Senior Research & Technology Advisor, working closely with GE's diverse global businesses to advance their technology and product plans. He assumed this position on August 1, 2000, following eight years as Senior Vice President, Corporate R&D.
Under Dr. Edelheit's leadership of Corporate R&D, GE introduced many new products, including digital x-ray medical imagers, high-efficiency turbines for power generation, advanced electronics-based lighting systems and appliances, and weatherable plastics, to name a few, and made significant advances in high-technology services and Internet applications. His organization also vastly expanded, opening new technology centers in India, Mexico, and China, and played a leadership role in advancing company-wide Six Sigma Quality and e-Engineering initiatives.
Dr. Edelheit holds a B.S. degree in engineering physics and an M.S. degree and Ph.D. in physics, all from the University of Illinois. He is a member of the National Academy of Engineering, the Industrial Research Institute, and the American Physical Society and serves on the boards of Rensselaer Polytechnic Institute and the Harvard Medical and Beth Israel Deaconess Research and Education Institute. His awards and honors include the University of Illinois College of Engineering Alumni Award for Distinguished Service.
Hans J Coufal (Chair), Federico Capasso, Chauncy Starr ('00 Recipient), James McCambridge (Vice Chair), Robert Schwartz